Our CT-Equipment and Software Tools

The CT research group of the Campus Wels has four CT-systems. In 2004, the first 3DCT device in Austria was installed at Upper Austria University of Applied Sciences - Campus Wels. Four years later, in 2008, the research group computed tomography bought a second 3DCT device, in order to expand its application areas into sub-µm resolution. In 2015 the group acquired an Phase-Contrast X-Ray Microtomograph. The latest addition is a nanoscale device. Below, further information is given on device specifications and application fields of our CT-systems.

Procon CT-Alpha

The Dual Source computed tomograph CT-Alpha was installed at the FHOÖ Wels Campus in November 2004 and upgraded to the current state in 2022. The device has two X-ray sources: the microfocus X-ray sourceX-Ray WorX XWT-300-CT Plus is suitable for high-resolution measurements, the minifocus X-ray Comet MXR-451HP/11 for high penetration lengths. The detector implemented is an a-Si (amorphous silicon) detector type PerkinElmer XRD 1620 AN14 CTS converting X-rays via a    scintillation layer into visible light. The technical data on the device is listed below:

  • 240-kV-microfocus- and 450-kV-minifocus tube
  • 2048 * 2048 pixel 16 bit a-Si flat panel detector
  • Minimum voxel size: 5 µm (max. sample diameter / 2048)
  • Sample weight < 80 kg
  • Sample diameter < 310 mm (with scan range enlargement < 600 mm)
  • Sample length <1,8 m
  • Maximum penetration length microfocus 240 kV: polymers - max. 200 mm, aluminium - max. 120 mm, steel - max. 30 mm
  • Maximum penetration length minifocus 450 kV: polymers - max. 500 mm, aluminium - max. 250 mm, steel - max. 70 mm
  • "Region of Interest" measurement mode for flat components
  • Radioscopy mode with up to 7 fps
Phoenix/X-Ray Nanotom 180

The high-resolution Sub-µm computed tomography device phoenix|x-ray (Part of GE Sensing and Inspection Technologies) Nanotom 180 has been started up in February 2008. The system includes a nanofocus X-ray source with transmission target and a max. acceleration voltage of 180 kV. The Nanotom detector type Hamamatsu C7942SK-05 allows for a scanning space with a resolution of 2300 * 2300 pixels.

Detailed technical data of the Sub-µm device is listed below:

  • 180-kV-nanofocus tube with minimum focal spot diameter of < 1 µm
  • 2300 * 2300 pixel 12 bit Hamamatsu detector
  • Triple-scan range enlargement mode
  • Minimum voxel size: 0,5 µm (max. sample diameter / 2300)
  • Sample weight < 2 kg
  • Sample diameter < 68 mm (with scan range enlargement < 210 mm)
  • Sample length < 150 mm
  • Maximum penetration length: polymers - max. 50 mm, aluminium - max. 30 mm, steel - max. 4 mm
RX Solutions Easytom 160

The high-resolution nano computed tomography device EasyTom 160 from RX Solutions has been started up in April 2017. The system includes a nanofocus X-ray source with transmission target and a max. acceleration voltage of 160 kV, which can be mounted with tungsten or LaB6 filaments. The nano device can be operated either with a flat panel detector with 1920 * 1536 pixels for higher energies and faster data acquisition or with a CCD camera with 4008 * 2672 pixels for lower energies and higher resolution.

Detailed technical data of the device is listed below:

  • 160 kV Hamamatsu nanofocus tube with focal spot diameter of < 400 nm (LaB6 filament)
  • 1920 * 1536 pixel 16 bit Varian flat panel detector
  • 4032 * 2688 pixel 14 bit CCD camera
  • Measurement of materials with low density < 1 g/cm^3
  • Triple-scan range enlargement mode
  • Minimum voxel size: 50 nm
  • Sample weight < 20 kg
  • Sample diameter < 200 mm
  • Sample length < 700 mm
  • Maximum penetration length: polymers - max. 50 mm, aluminium - max. 30 mm, steel - max. 4 mm
Skyscan 1294

The SkyScan 1294 desktop phase-contrast X-ray microtomograph was installed at the FH OÖ Campus Wels in January 2015. The system includes a specially designed micro-focus X-ray source, a 11 megapixel X-ray camera and a precise three-grating Talbot-Lau X-ray interferometer for simultaneous extraction of absorption contrast, differential phase contrast and dark-field images. This phase-contrast system will primarily be used for detailed investigation of polymeric and biologic material systems. The technical data on the device is listed below:

  • 60-kV-microfocus tube with a focal spot diameter of 33 µm
  • 4000 * 2672 pixel 12 bit detector
  • Measurement of materials with low density < 2 g/cm³
  • Minimum voxel size: 5.7 µm
  • Sample diameter < 20 mm
  • Sample length < 60 mm

The following means of evaluation are at the research groups disposal:

  • VG Studio Max with additional modules
  • MAVI
  • IAR (Iterative Artefact Reductions) software
  • Actual-nominal comparison tools
  • Zeiss Calypso with CT-extensions
  • Our in-house developed tools
FHOÖ Equipment

Aside the afore mentioned computed tomography devices, the extensive and modern university equipment includes the following technologies: 

  • Serial sectioning Tescan Vega / Oxford
  • Scanning electron microscope with X-ray microprobe for chemical analysis
  • Testing equipment for active thermography
  • Testing equipment for shearography
  • Optical scanner GOM Athos
  • Coordinate measurement device Zeiss Spektrum 7/7/6
  • Rapid prototyping device:
    • 3D-printer (Z-Cooperation)
    • Laser melting / -sintering device (Concept)
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